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Trapped Ion Quantum Computing
Quantum Simulation
Quantum certification and benchmarking
arXiv
Authors: J. Eisert, D. Hangleiter, N. Walk, I. Roth, D. Markham, R. Parekh, U. Chabaud, E. Kashefi
Year
2019
Paper ID
7215
Status
Preprint
Abstract Read
~2 min
Abstract Words
74
Citations
N/A
Abstract
Concomitant with the rapid development of quantum technologies, challenging demands arise concerning the certification and characterization of devices. The promises of the field can only be achieved if stringent levels of precision of components can be reached and their functioning guaranteed. This review provides a brief overview of the known characterization methods of certification, benchmarking, and tomographic recovery of quantum states and processes, as well as their applications in quantum computing, simulation, and communication.
Why This Paper Matters
- This paper contributes to the Quantum Simulation research area in the Quantum Articles archive.
- It adds a 2019 reference point for readers tracking recent quantum research.
- Concomitant with the rapid development of quantum technologies, challenging demands arise concerning the certification and characterization of devices.
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