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Superconducting Qubits Spin Qubits Silicon Quantum Computing Quantum Chemistry

Identifying impurities in a silicon substrate by using a superconducting flux qubit

arXiv
Authors: Hiraku Toida, Kosuke Kakuyanagi, Leonid V. Abdurakhimov, Masahiro Hori, Yukinori Ono, Shiro Saito

Year

2024

Paper ID

66253

Status

Preprint

Abstract Read

~2 min

Abstract Words

94

Citations

N/A

Abstract

A bismuth-doped silicon substrate was analyzed by using a magnetometer based on a superconducting flux qubit. The temperature dependence of the magnetization indicates that the silicon substrate contains at least two signal sources, intentionally doped bismuth spins and a spin 1/2 system with a ratio of 0.873 to 0.127. In combination with a conventional electron spin resonance spectrometer, a candidate origin of the spin 1/2 system was identified as a dangling bond on the silicon surface. In addition, the spin sensitivity of the magnetometer was also estimated to be 12 spins/sqrt{Hz} by using optimized dispersive readout.

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  • A bismuth-doped silicon substrate was analyzed by using a magnetometer based on a superconducting flux qubit.

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