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Laser ablation loading of a surface-electrode ion trap

arXiv
Authors: David R. Leibrandt, Robert J. Clark, Jaroslaw Labaziewicz, Paul Antohi, Waseem Bakr, Kenneth R. Brown, Isaac L. Chuang

Year

2007

Paper ID

49880

Status

Preprint

Abstract Read

~2 min

Abstract Words

100

Citations

N/A

Abstract

We demonstrate loading by laser ablation of 88Sr^+ ions into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 3-5 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful $gtrsim$ 500 meV.

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  • This paper contributes to the Quantum Chemistry research area in the Quantum Articles archive.
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  • We demonstrate loading by laser ablation of ^88Sr^+ ions into a mm-scale surface-electrode ion trap.

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References & Citation Signals

[1] DOI https://doi.org/arXiv:0706.3374 [2] arXiv https://arxiv.org/abs/0706.3374 [3] Publisher https://arxiv.org/abs/0706.3374

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