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Light-Induced Depletion-Region Modulation in a PtTe(2)/Ga(2)O(3) Schottky Junction Field-Effect Transistor for Solar-Blind UV Detection.

PubMed
Authors: Yang Z, Peng X, Li Y, Zhou S, Wang X, Cheng Q, Yang W

Year

2026

Paper ID

28323

Status

Peer-reviewed

Abstract Read

~2 min

Abstract Words

154

Citations

1

Abstract

The solar-blind phototransistor is a three-terminal device capable of substantially suppressing dark current and reducing noise solely through gate-voltage modulation. In this work, we report a top-gate β-GaO metal-semiconductor field-effect transistor employing a semimetal PtTe gate that forms a dielectric-free van der Waals (vdW) Schottky contact with the channel. The corresponding transistor exhibits a minimal hysteresis of 80 mV, an extremely low OFF-state current of ≈10 fA, and an ON/OFF current ratio exceeding 10. The phototransistor demonstrates excellent device performance in terms of a record-high photo-to-dark current ratio of 1.13 × 10, a high responsivity of 6.75 × 10 A/W, a large external quantum efficiency of 3.3 × 10 %, and a high specific detectivity of 4.46 × 10 Jones. These excellent characteristics are attributed to the top-gate-induced modulation of the depletion region, which suppresses dark current, and to the enhanced photocurrent generated by the synergistic response of the PtTe/β-GaO interface under illumination. The PtTe/β-GaO phototransistor provides a promising pathway toward high-responsivity and high-detectivity solar-blind optoelectronics.

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  • The solar-blind phototransistor is a three-terminal device capable of substantially suppressing dark current and reducing noise solely through gate-voltage modulation.

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External citation index: OpenAlex citation signal • updated 2026-06-14 08:24:50

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