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Atomic force microscopy and ellipsometry investigations of rare earth oxide Dy2O3 nano-layer processed by electron beam evaporation on n-GaAs substrate

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Authors: W. Ouerghui, H. Saghrouni, L. Beji

Year

2023

Paper ID

11742

Status

Peer-reviewed

Abstract Read

~2 min

Abstract Words

0

Citations

16

Abstract

No abstract available.

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Current Paper #11742 #69042 Simultaneous Fragment Docking f... #69037 Spin dynamics and ortho-para co... #69012 Projector Quantum Variational A... #69006 Elucidating the Control of Circ...

External citation index: OpenAlex citation signal • updated 2026-06-18 13:40:35

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