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Charged basal stacking fault (BSF) scattering in nitride semiconductors
arXiv
Authors: Aniruddha Konar, Tian Fang, Nan Sun, Debdeep Jena
Year
2010
Paper ID
10597
Status
Preprint
Abstract Read
~2 min
Abstract Words
57
Citations
N/A
Abstract
A theory of charge transport in semiconductors in the presence of basal stacking faults is developed. It is shown that the presence of basal stacking faults leads to anisotropy in carrier transport. The theory is applied to carrier transport in non-polar GaN films consisting of a large number BSFs, and the result is compared with experimental data.
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- This paper contributes to the Quantum Chemistry research area in the Quantum Articles archive.
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- A theory of charge transport in semiconductors in the presence of basal stacking faults is developed.
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