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Charged basal stacking fault (BSF) scattering in nitride semiconductors

arXiv
Authors: Aniruddha Konar, Tian Fang, Nan Sun, Debdeep Jena

Year

2010

Paper ID

10597

Status

Preprint

Abstract Read

~2 min

Abstract Words

57

Citations

N/A

Abstract

A theory of charge transport in semiconductors in the presence of basal stacking faults is developed. It is shown that the presence of basal stacking faults leads to anisotropy in carrier transport. The theory is applied to carrier transport in non-polar GaN films consisting of a large number BSFs, and the result is compared with experimental data.

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  • This paper contributes to the Quantum Chemistry research area in the Quantum Articles archive.
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  • A theory of charge transport in semiconductors in the presence of basal stacking faults is developed.

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