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Trapped Ion Quantum Computing
Corner Charge Fluctuation as an Observable for Quantum Geometry and Entanglement in Two-dimensional Insulators
arXiv
Authors: Pok Man Tam, Jonah Herzog-Arbeitman, Jiabin Yu
Year
2024
Paper ID
66149
Status
Preprint
Abstract Read
~2 min
Abstract Words
165
Citations
N/A
Abstract
Measuring bipartite fluctuations of a conserved charge, such as the particle number, is a powerful approach to understanding quantum systems. When the measured region has sharp corners, the bipartite fluctuation receives an additional contribution known to exhibit a universal angle-dependence in 2D isotropic and uniform systems. Here we establish that, for generic lattice systems of interacting particles, the corner charge fluctuation is directly related to quantum geometry. We first provide a practical scheme to isolate the corner contribution on lattices, and analytically prove that its angle-dependence in the small-angle limit measures exclusively the integrated quantum metric. A model of a compact obstructed atomic insulator is introduced to illustrate this effect analytically, while numerical verification for various Chern insulator models further demonstrate the experimental relevance of the corner charge fluctuation in a finite-size quantum simulator as a probe of quantum geometry. Last but not least, for free fermions, we unveil an intimate connection between quantum geometry and quantum information through the lens of corner entanglement entropies.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2024 reference point for readers tracking recent quantum research.
- Measuring bipartite fluctuations of a conserved charge, such as the particle number, is a powerful approach to understanding quantum systems.
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