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Trapped Ion Quantum Computing

Measurement-Based Long-Range Entangling Gates in Constant Depth

arXiv
Authors: Elisa Bäumer, Stefan Woerner

Year

2024

Paper ID

64550

Status

Preprint

Abstract Read

~2 min

Abstract Words

125

Citations

N/A

Abstract

The depth of quantum circuits is a critical factor when running them on state-of-the-art quantum devices due to their limited coherence times. Reducing circuit depth decreases noise in near-term quantum computations and reduces overall computation time, thus, also benefiting fault-tolerant quantum computations. Here, we show how to reduce the depth of quantum sub-routines that typically scale linearly with the number of qubits, such as quantum fan-out and long-range CNOT gates, to a constant depth using mid-circuit measurements and feed-forward operations, while only requiring a 1D line topology. We compare our protocols with existing ones to highlight their advantages. Additionally, we verify the feasibility by implementing the measurement-based quantum fan-out gate and long-range CNOT gate on real quantum hardware, demonstrating significant improvements over their unitary implementations.

Why This Paper Matters

  • This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
  • It adds a 2024 reference point for readers tracking recent quantum research.
  • The depth of quantum circuits is a critical factor when running them on state-of-the-art quantum devices due to their limited coherence times.

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