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Trapped Ion Quantum Computing
Measurement-Based Long-Range Entangling Gates in Constant Depth
arXiv
Authors: Elisa Bäumer, Stefan Woerner
Year
2024
Paper ID
64550
Status
Preprint
Abstract Read
~2 min
Abstract Words
125
Citations
N/A
Abstract
The depth of quantum circuits is a critical factor when running them on state-of-the-art quantum devices due to their limited coherence times. Reducing circuit depth decreases noise in near-term quantum computations and reduces overall computation time, thus, also benefiting fault-tolerant quantum computations. Here, we show how to reduce the depth of quantum sub-routines that typically scale linearly with the number of qubits, such as quantum fan-out and long-range CNOT gates, to a constant depth using mid-circuit measurements and feed-forward operations, while only requiring a 1D line topology. We compare our protocols with existing ones to highlight their advantages. Additionally, we verify the feasibility by implementing the measurement-based quantum fan-out gate and long-range CNOT gate on real quantum hardware, demonstrating significant improvements over their unitary implementations.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2024 reference point for readers tracking recent quantum research.
- The depth of quantum circuits is a critical factor when running them on state-of-the-art quantum devices due to their limited coherence times.
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