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Superconducting Qubits Quantum Error Correction Fault Tolerance

Cryogenic Time-Division-Multiplexed Voltage Control for Scalable Trapped-Ion Quantum Processors

arXiv
Authors: Ryutaro Ohira, Shinichi Morisaka, Yoshinori Kurimoto, Toshiaki Inada, Ippei Nakamura, Takefumi Miyoshi, Atsushi Noguchi

Year

2026

Paper ID

63820

Status

Preprint

Abstract Read

~2 min

Abstract Words

195

Citations

0

Abstract

Trapped-ion quantum computers based on the quantum charge-coupled device architecture require on the order of ten trap electrodes per qubit, making the number of vacuum feedthroughs a bottleneck at the system scale. Time-division multiplexed (TDM)-based voltage control for trap electrodes provides a natural route to alleviate this constraint. However, previous studies have been limited to architectural proposals for static trap-potential compensation and room-temperature demonstrations of dynamic-electrode control, leaving cryogenic operation of TDM-based voltage control for static and dynamic electrodes experimentally unexplored. In this study, we develop and cryogenically validate TDM-based voltage control schemes for two distinct electrode classes. For static electrodes used in trap-potential compensation, we implement a 32-channel demultiplexed system operating at approximately 27 K, achieving an effective voltage update rate of 37.5 kHz with an output range of pm10 V per channel. For dynamic electrodes used in ion operations, such as shuttling, we implement a four-channel demultiplexed system operating at approximately 14 K, achieving an effective voltage update rate of 1 MHz with a comparable output range. These results establish TDM-based voltage control as a practical approach for both electrode classes, providing a path for mitigating the vacuum feedthrough bottleneck in scalable trapped-ion quantum processors.

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