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Trapped Ion Quantum Computing
Fundamental limits of quantum error mitigation
arXiv
Authors: Ryuji Takagi, Suguru Endo, Shintaro Minagawa, Mile Gu
Year
2021
Paper ID
61677
Status
Preprint
Abstract Read
~2 min
Abstract Words
140
Citations
N/A
Abstract
The inevitable accumulation of errors in near-future quantum devices represents a key obstacle in delivering practical quantum advantages, motivating the development of various quantum error-mitigation methods. Here, we derive fundamental bounds concerning how error-mitigation algorithms can reduce the computation error as a function of their sampling overhead. Our bounds place universal performance limits on a general error-mitigation protocol class. We use them to show (1) that the sampling overhead that ensures a certain computational accuracy for mitigating local depolarizing noise in layered circuits scales exponentially with the circuit depth for general error-mitigation protocols and (2) the optimality of probabilistic error cancellation among a wide class of strategies in mitigating the local dephasing noise on an arbitrary number of qubits. Our results provide a means to identify when a given quantum error-mitigation strategy is optimal and when there is potential room for improvement.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2021 reference point for readers tracking recent quantum research.
- The inevitable accumulation of errors in near-future quantum devices represents a key obstacle in delivering practical quantum advantages, motivating the development of various...
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