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Trapped Ion Quantum Computing

Fundamental limits of quantum error mitigation

arXiv
Authors: Ryuji Takagi, Suguru Endo, Shintaro Minagawa, Mile Gu

Year

2021

Paper ID

61677

Status

Preprint

Abstract Read

~2 min

Abstract Words

140

Citations

N/A

Abstract

The inevitable accumulation of errors in near-future quantum devices represents a key obstacle in delivering practical quantum advantages, motivating the development of various quantum error-mitigation methods. Here, we derive fundamental bounds concerning how error-mitigation algorithms can reduce the computation error as a function of their sampling overhead. Our bounds place universal performance limits on a general error-mitigation protocol class. We use them to show (1) that the sampling overhead that ensures a certain computational accuracy for mitigating local depolarizing noise in layered circuits scales exponentially with the circuit depth for general error-mitigation protocols and (2) the optimality of probabilistic error cancellation among a wide class of strategies in mitigating the local dephasing noise on an arbitrary number of qubits. Our results provide a means to identify when a given quantum error-mitigation strategy is optimal and when there is potential room for improvement.

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  • This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
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  • The inevitable accumulation of errors in near-future quantum devices represents a key obstacle in delivering practical quantum advantages, motivating the development of various...

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