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Cryogenic Electronics Quantum Control Stack Trapped Ion Quantum Computing Quantum Measurement State Discrimination Quantum Gate Fidelity Benchmarking

Red-emitting In<sub> <i>x</i> </sub>Ga<sub>1−<i>x</i> </sub>N/In<sub> <i>y</i> </sub>Ga<sub>1−<i>y</i> </sub>N quantum wells grown on lattice-matched In<sub> <i>y</i> </sub>Ga<sub>1−<i>y</i> </sub>N/ScAlMgO<sub>4</sub>(0001) templates

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Authors: Takuya Ozaki, Mitsuru Funato, Yoichi Kawakami

Year

2018

Paper ID

5582

Status

Peer-reviewed

Abstract Read

~2 min

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0

Citations

62

Abstract

No abstract available.

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  • This paper contributes to the Quantum Gate Fidelity & Benchmarking research area in the Quantum Articles archive.
  • It adds a 2018 reference point for readers tracking recent quantum research.

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References & Citation Signals

[1] DOI https://doi.org/10.7567/1882-0786/aaf4b1 [2] Publisher https://doi.org/10.7567/1882-0786/aaf4b1

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Current Paper #5582

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