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Quantum Machine Learning
Boosting Defect Detection in Manufacturing using Tensor Convolutional Neural Networks
arXiv
Authors: Pablo Martin-Ramiro, Unai Sainz de la Maza, Sukhbinder Singh, Roman Orus, Samuel Mugel
Year
2023
Paper ID
52957
Status
Preprint
Abstract Read
~2 min
Abstract Words
139
Citations
N/A
Abstract
Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real defect detection application in one of the components of the ultrasonic sensors produced at Robert Bosch's manufacturing plants. Our quantum-inspired T-CNN operates on a reduced model parameter space to substantially improve the training speed and performance of an equivalent CNN model without sacrificing accuracy. More specifically, we demonstrate how T-CNNs are able to reach the same performance as classical CNNs as measured by quality metrics, with up to fifteen times fewer parameters and 4% to 19% faster training times. Our results demonstrate that the T-CNN greatly outperforms the results of traditional human visual inspection, providing value in a current real application in manufacturing.
Why This Paper Matters
- This paper contributes to the Quantum Machine Learning research area in the Quantum Articles archive.
- It adds a 2023 reference point for readers tracking recent quantum research.
- Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector.
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