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Quantum Sensing Metrology
Near-Deterministic Weak-Value Metrology via Collective non-Linearity
arXiv
Authors: Muthumanimaran Vetrivelan, Sai Vinjanampathy
Year
2020
Paper ID
522
Status
Preprint
Abstract Read
~2 min
Abstract Words
88
Citations
N/A
Abstract
Weak-value amplification employs postselection to enhance the measurement of small parameters of interest. The amplification comes at the expense of reduced success probability, hindering the utility of this technique as a tool for practical metrology. Following other quantum technologies that display a quantum advantage, we formalize a quantum advantage in the success probability and present a scheme based on non-linear collective Hamiltonians that shows a super-extensive growth in success probability while simultaneously displaying an extensive growth in the weak value. We propose an experimental implementation of our scheme.
Why This Paper Matters
- This paper contributes to the Quantum Sensing & Metrology research area in the Quantum Articles archive.
- It adds a 2020 reference point for readers tracking recent quantum research.
- Weak-value amplification employs postselection to enhance the measurement of small parameters of interest.
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