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In Situ Composition and Thickness Monitoring during (Bi <sub>x</sub> In <sub>1-x</sub> ) <sub>2</sub> Se <sub>3</sub> Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices
Year
2026
Paper ID
45302
Status
Peer-reviewed
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- This paper contributes to the Quantum Chemistry research area in the Quantum Articles archive.
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