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Trapped Ion Quantum Computing
Bounding the Sample Fluctuation for Pure States Certification with Local Random Measurement
arXiv
Authors: Langxuan Chen, Pengfei Zhang
Year
2024
Paper ID
37819
Status
Preprint
Abstract Read
~2 min
Abstract Words
163
Citations
N/A
Abstract
Remarkable breakthroughs in quantum science and technology are demanding for more efficient methods in analyzing quantum many-body states. A significant challenge in this field is to verify whether a quantum state prepared by quantum devices in the lab accurately matches the desired target pure state. Recent advancements in randomized measurement techniques have provided fresh insights in this area. Specifically, protocols such as classical shadow tomography and shadow overlap have been proposed. Building on these developments, we investigate the fundamental properties of schemes that certify pure quantum states through random local Haar measurements. We derive bounds for sample fluctuations that are applicable regardless of the specific estimator construction. These bounds depend on the operator size distribution of either the observable used to estimate fidelity or the valid variation of the reduced density matrix for arbitrary observables. Our results unveil the intrinsic interplay between operator complexity and the efficiency of quantum algorithms, serving as an obstacle to local certification of pure states with long-range entanglement.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2024 reference point for readers tracking recent quantum research.
- Remarkable breakthroughs in quantum science and technology are demanding for more efficient methods in analyzing quantum many-body states.
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