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Trapped Ion Quantum Computing
On Quantum Reliability Characterizing Systematic Errors in Quantum Sensing
arXiv
Authors: Lian-Xiang Cui, Yi-Mu Du, C. P. Sun
Year
2024
Paper ID
37595
Status
Preprint
Abstract Read
~2 min
Abstract Words
134
Citations
N/A
Abstract
Quantum sensing utilize quantum effects, such as entanglement and coherence, to measure physical signals. The performance of a sensing process is characterized by error which requires comparison to a true value. However, in practice, such a true value might be inaccessible. In this study, we utilize quantum reliability as a metric to evaluate quantum sensor's performance based solely on the apparatus itself, without any prior knowledge of true value. We derive a general relationship among reliability, sensitivity, and systematic error, and demonstrate this relationship using a typical quantum sensing process. That is to measure magnetic fields (as a signal) by a spin-1/2 particle and using the Stern-Gerlach apparatus to read out the signal information. Our findings illustrate the application of quantum reliability in quantum sensing, opening new perspectives for reliability analysis in quantum systems.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2024 reference point for readers tracking recent quantum research.
- Quantum sensing utilize quantum effects, such as entanglement and coherence, to measure physical signals.
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