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Trapped Ion Quantum Computing
Quantum Metrology via Repeated Quantum Nondemolition Measurements in "Photon Box"
arXiv
Authors: Yu-Ran Zhang, Jie-Dong Yue, Heng Fan
Year
2013
Paper ID
31740
Status
Preprint
Abstract Read
~2 min
Abstract Words
160
Citations
N/A
Abstract
In quantum metrology schemes, one generally needs to prepare m copies of N entangled particles, such as entangled photon states, and then they are detected in a destructive process to estimate an unknown parameter. Here, we present a novel experimental scheme for estimating this parameter by using repeated indirect quantum nondemolition measurements in the setup called "photon box". This interaction-based scheme is able to achieve the phase sensitivity scaling as 1/N with a Fock state of N photons. Moreover, we only need to prepare one initial N-photon state and it can be used repetitively for m trials of measurements. This new scheme is shown to sustain the quantum advantage for a much longer time than the damping time of Fock state and be more robust than the common strategy with exotic entangled states. To overcome the 2π/N periodic error in the estimation of the true parameter, we can employ a cascaded strategy by adding a real-time feedback interferometric layout.
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- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
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- In quantum metrology schemes, one generally needs to prepare m copies of N entangled particles, such as entangled photon states, and then they are detected in a destructive...
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