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Instance-optimal high-precision shadow tomography with few-copy measurements: A metrological approach

arXiv
Authors: Senrui Chen, Weiyuan Gong, Sisi Zhou

Year

2026

Paper ID

2847

Status

Preprint

Abstract Read

~2 min

Abstract Words

259

Citations

N/A

Abstract

We study the sample complexity of shadow tomography in the high-precision regime under realistic measurement constraints. Given an unknown d-dimensional quantum state ρ and a known set of observables \{Oi\}i=1m, the goal is to estimate expectation values \{tr\(Oiρ\)\}i=1m to accuracy ε in Lp-norm, using possibly adaptive measurements that act on O\(polylog(d\)) number of copies of ρ at a time. We focus on the regime where ε is below an instance-dependent threshold. Our main contribution is an instance-optimal characterization of the sample complexity as Θ\(Γp2\), where Γp is a function of \{Oi\}i=1m defined via an optimization formula involving the inverse Fisher information matrix. Previously, tight bounds were known only in special cases, e.g. Pauli shadow tomography with Linfty-norm error. Concretely, we first analyze a simpler oblivious variant where the goal is to estimate an observable of the form sumi=1m αi Oi with \|α\|q = 1 (where q is dual to p) revealed after the measurement. For single-copy measurements, we obtain a sample complexity of Θ\(Γobp2\). We then show Θ\(Γp2\) is necessary and sufficient for the original problem, with the lower bound applying to unbiased, bounded estimators. Our upper bounds rely on a two-step algorithm combining coarse tomography with local estimation. Notably, Γobinfty = Γinfty. In both cases, allowing c-copy measurements improves the sample complexity by at most Ω(1/c). Our results establish a quantitative correspondence between quantum learning and metrology, unifying asymptotic metrological limits with finite-sample learning guarantees.

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  • This paper contributes to the Quantum State/Process Tomography research area in the Quantum Articles archive.
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  • We study the sample complexity of shadow tomography in the high-precision regime under realistic measurement constraints.

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