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Quantum Error Correction Fault Tolerance

Characterizing Universal Gate Sets via Dihedral Benchmarking

arXiv
Authors: Arnaud Carignan-Dugas, Joel J. Wallman, Joseph Emerson

Year

2015

Paper ID

27625

Status

Preprint

Abstract Read

~2 min

Abstract Words

108

Citations

N/A

Abstract

We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2) associated with arbitrarily small angle rotations. Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition. Combining this protocol with existing randomized benchmarking schemes enables an efficient means of characterizing universal gate sets for quantum information processing in a way that is independent of state-preparation and measurement errors. In particular, our protocol enables direct benchmarking of the T gate (sometime called π/8-gate) even for the gate-dependent error model that is expected in leading approaches to fault-tolerant quantum computation.

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  • We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2)...

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References & Citation Signals

[1] DOI https://doi.org/arXiv:1508.06312 [2] arXiv https://arxiv.org/abs/1508.06312 [3] Publisher https://arxiv.org/abs/1508.06312

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