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Trapped Ion Quantum Computing
Quantum State Certification via Effective Parent Hamiltonians from Local Measurement Data
arXiv
Authors: Guy-Philippe Nadon, Guanyi Heng, Pacôme Gasnier, Antoine Lemelin, Camille Coti, Zeljko Zilic, Mikko Möttönen, Ville Kotovirta, Toni Annala, Ernesto Campos, Jacob Biamonte
Year
2026
Paper ID
25811
Status
Preprint
Abstract Read
~2 min
Abstract Words
135
Citations
N/A
Abstract
The preparation and certification of quantum states is a fundamental challenge across quantum information technology. We introduce a tomography-free state certification method that lower-bounds the fidelity by estimating expectation values of engineered parent-Hamiltonian terms from local measurement data. We apply this framework to construct a parent Hamiltonian that enables certification and variational optimization across the Dicke-state family, which includes the single-excitation Wn state. We experimentally validate the framework on IBM quantum hardware, certifying genuine multipartite entanglement for Wn states up to six qubits and establishing positive lower bounds on the state fidelity up to thirteen qubits. For Dicke states with two- and three-excitations, we certify genuine multipartite entanglement up to seven qubits. Within this stringent certification framework, these results constitute among the largest witness-certified demonstrations of such states on a programmable quantum processor.
Why This Paper Matters
- This paper contributes to the Trapped-Ion Quantum Computing research area in the Quantum Articles archive.
- It adds a 2026 reference point for readers tracking recent quantum research.
- The preparation and certification of quantum states is a fundamental challenge across quantum information technology.
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