Reliability analysis of photoluminescence measurement data from the intrinsic limitation on the instrument to the practical limitations during the experiments.

Photoluminescence spectroscopy serves as a fundamental characterization technique widely employed in chemistry and materials science research. The reliability of the original data is crucial, as it directly determines the scientific conclusions obtained based on data processing and analysis. This work presents a systematic investigation of factors influencing photoluminescence data reliability through comprehensive analysis of the complete optical pathway, including the instrument intrinsic limitations and practical experimental limitations. Key findings reveal that instrument grating performance at the excitation site can lead to the introduction of some stray light within the range of 350 nm-500 nm at excitation wavelengths below 300 nm, thereby resulting in photoluminescence artifacts in certain sample analyses. These artifacts can be addressed through optimization of the excitation light wavelength and adjustment of the excitation/emission silt dimensions. The practical limitations during the experiments, such as the interaction of the excitation light with the sample including the scattering light, sample container, and the secondary reflected light of the laser, can all influence the data reliability. Notably, the secondary reflected light of the laser under ultrafast measurement conditions may distort temporal decay profiles, requiring precise control of the laser's incident angle or sample orientation. Excessively strong scattering light will lead to the presence of stray light across a broad range of the emission spectrum through the grating multi-stage diffraction. By implementing the proposed methodologies, researchers can substantially improve the accuracy and reproducibility of photoluminescence data. This work provides a practical framework for acquiring reliable photoluminescence spectra and decay kinetics across diverse material systems.